Abstract
In th is reported wor k, the analo gy between parallel electrical arcs and memristors is extended to hi gh-impedance faults such as carbonised paths and circuit openings. First, it is demonstrated th at the conductance from th e high-impedance Mayr model behaves like a particular memd uctance sensitive to the integral of the squared current. Then, the current-voltage plot confi rms the memristive behaviour of highimped ance faults, both by simulation and with experimental results.
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CITATION STYLE
Tisserand, E., Berviller, Y., & Humbert, J. B. (2016). Memristive behaviour of high-impedance faults. Electronics Letters, 52(4), 300–302. https://doi.org/10.1049/el.2015.3738
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