Abstract
We demonstrate that synchrotron x-ray powder diffraction (XRD) is a powerful technique for studying the structure and self-organization of zinc-oxide nanostructures. Zinc-oxide nanorods were prepared by a solution-growth method that resulted in uniform nanorods with 2-nm diameter and lengths in the range 10-50 nm. These nanorods were structurally characterized by a combination of small-angle and wide-angle synchrotron XRD and transmission electron microscopy (TEM). Small-angle XRD and TEM were used to investigate nanorod self-assembly and the influence of surfactant/precursor ratio on self-assembly. Wide-angle XRD was used to study the evolution of nanorod growth as a function of synthesis time and surfactant/precursor ratio. © 2005 Materials Research Society.
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CITATION STYLE
Zhu, Z., Andelman, T., Yin, M., Chen, T. L., Ehrlich, S. N., O’Brien, S. P., & Osgood, R. M. (2005). Synchrotron x-ray scattering of ZnO nanorods: Periodic ordering and lattice size. Journal of Materials Research, 20(4), 1033–1041. https://doi.org/10.1557/JMR.2005.0134
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