An Overview on Calibration Techniques for Radio Frequency Integrated Circuits

Abstract

Radio Frequency Integrated Circuits (RFICs) show poor robustness to static non-ideal factors introduced by process deviations, device mismatches, device nonlinearities, and dynamic non-ideal factors introduced by temperature changes, gain changes, and input/output frequency changes. The key factors that affect the performance of RFICs are excavated deeply, and typical calibration algorithms are summarized to provide theoretical support for the design of high-performance RFICs.