Operando Characterization of Electrochemistry at the Rutile TiO2(110)/0.1 M HCl Interface Using Ambient Pressure XPS

Abstract

Ambient pressure X-ray photoelectron spectroscopy (AP-XPS) was employed to investigate the effect of applied potential on the interface of TiO2(110) with 0.1 M HCl. The study, which involved operando electrochemical characterization, enabled real-time monitoring and analysis of electrochemical processes. There is a significant influence on the interface composition; in particular, the surface Cl- surface coverage varies with electrochemical potential. Moreover, there appears to be a reaction of evolved Cl with adventitious carbon to form C-Cl and C-Cl2 species.