Information extraction from Murphy–Good plots of tungsten field electron emitters

Abstract

This study introduces an easy methodology to test and analyze experimental field electron emission current-voltage data from metallic single-tip emitters; this novel and easy methodology is called the Murphy–Good plots. Tungsten electron emitters were used as an example and were prepared by the electrochemical etching process. The current-voltage characteristics are obtained in high vacuum levels and using a traditional field emission microscope. Murphy–Good plots are used to apply the well-known field electron emission orthodoxy test to the experimental data and then to extract the emitters’ characterization parameters if the test is passed. The novelty in using this type of plots lies in its independency on any correction factors, unlike the traditional Fowler–Nordheim and Millikan–Lauritsen plots, in addition to its simple theoretical form. The results are calculated using a simple web tool that applies the field electron emission orthodoxy test to any type of the current-voltage analysis plots and then to extract the characterization parameters of the emitters.