Abstract
Automotive microelectronics are gaining great impact with the advent of electromobility and self-driving cars. Being a mass market, cost sensitivity is a major concern, while the functional safety, security, stringent run-time requirements and reliable operation are still major challenges. Automotive Reliability and Test (ART) has been the most popular topic at the recent IEEE International Test Conferences, and the ART Workshop 2016 in conjunction with ITC was extremely popular. This special issue of IEEE Design&Test originates from this workshop and deals with the most significant topics in automotive reliability and test.
Cite
CITATION STYLE
Wunderlich, H. J., & Zorian, Y. (2018, June 1). Guest editor’s introduction. IEEE Design and Test. IEEE Computer Society. https://doi.org/10.1109/MDAT.2018.2799806
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
