A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory

17Citations
Citations of this article
6Readers
Mendeley users who have this article in their library.
Get full text

Abstract

In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The Phase-Frequency Detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision. ©2008 IEEE.

Cite

CITATION STYLE

APA

Hsu, A. J., Tu, C. C., & Huang, S. Y. (2008). A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory. In 2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT (pp. 267–270). https://doi.org/10.1109/VDAT.2008.4542464

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free