Photoluminescence microscopy of InGaN quantum wells

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Abstract

Submicron spatial resolution photoluminescence is used to assess radiative efficiency and spatial uniformity of GaN/InGaN heterojunctions. Room temperature photoluminescence of multiple InGaN quantum wells with GaN barriers fabricated by electron-cyclotron resonance assisted molecular beam epitaxy was measured as a function of position on a facet perpendicular to the layer structure. Our high resolution studies reveal that the radiative recombination for the InGaN quantum wells is 50-60 times more efficient than for the underlying GaN film. © 1997 American Institute of Physics.

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Herzog, W. D., Singh, R., Moustakas, T. D., Goldberg, B. B., & Ünlü, M. S. (1997). Photoluminescence microscopy of InGaN quantum wells. Applied Physics Letters, 70(11), 1333–1335. https://doi.org/10.1063/1.118600

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