This paper reports on the application of a Physics of Failure (PoF) methodology to assessing the reliability of a micro electro mechanical system (MEMS). Numerical simulations, based on the finite element method (FEM) using a sub-domain approach was used to examine the damage onset due to temperature variations (e.g. yielding of metals which may lead to thermal fatigue). In this work remeshing techniques were employed in order to develop a damage tolerance approach based on the assumption that initial flaws exist in the multi-layered. © 2011 Published under licence by IOP Publishing Ltd.
CITATION STYLE
Maligno, A. R., Whalley, D. C., & Silberschmidt, V. V. (2011). Damage assessment in multilayered MEMS structures under thermal fatigue. In Journal of Physics: Conference Series (Vol. 305). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/305/1/012046
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