Imaging the Acceptor Wave Function Anisotropy in Silicon

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Abstract

We present the first scanning tunneling microscopy (STM) image of hydrogenic acceptor wave functions in silicon. These acceptor states appear as square-ring-like features in STM images and originate from near-surface defects introduced by high-energy bismuth implantation into a silicon (001) wafer. Scanning tunneling spectroscopy confirms the formation of a p-type surface. Effective-mass and tight-binding calculations provide an excellent description of the observed square-ring-like features, confirming their acceptor character and attributing their symmetry to the light- and heavy-hole band degeneracy in silicon. A detailed understanding of the energetic and spatial properties of acceptor wave functions in silicon is essential for engineering large-scale acceptor-based quantum devices.

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Siegl, M., Zanon, J., Sink, J., Rodrigues da Cruz, A., Hedgeland, H., Curson, N. J., … Schofield, S. R. (2025). Imaging the Acceptor Wave Function Anisotropy in Silicon. Nano Letters, 25(38), 13996–14001. https://doi.org/10.1021/acs.nanolett.5c02675

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